Topic: Integration of Reliability, Availability and Maintainability (RAM) analysis and Operational Research (OR) modelling
Overview: Sellafield Ltd. uses a T-RAM (Throughput – Reliability, Availability and Maintainability) process to develop a reasoned auditable argument that a new plant, and its systems and subsystems, will meet its performance targets. In order to underpin the throughput capability of a new facility on the site, the Operational Research Team has developed a simulation model which has been used to feedback expected throughput based in input RAM data. This is an iterative process, with high risk bottleneck areas identified by the simulation model then becoming the focus of the T-RAM process, with the objective of continually reducing T-RAM risk.
Jacqueline Bishop works for Sellafield Ltd. as a Project Leader in the Operational Research Group. She is a Chartered Mathematician who leads a team of analysts, developing tools and models to help solve business problems. This ranges from data visualisations right through to complex discrete event simulation models. She has worked in the nuclear industry for 10 years in a number of technical roles
Mike McCarthy is a Reliability Consultant and has worked in many high technology sectors over the last 25 years. He is currently supporting Sellafield Ltd in the development and assurance of Throughput simulations and Reliability, Availability and Maintainability processes on several major projects.
Further information and booking details for the CRA Risk Forum which will be held on 26th and 27th September 2018 at The Cranage Estate, Holmes Chapel, Cheshire, CW4 8EW, UK can be found on our Risk Forum registration page.